Alta reperibilità
VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
- Editore:
Springer Berlin Heidelberg
- EAN:
9783642420238
- ISBN:
3642420230
- Pagine:
- 404
- Formato:
- Paperback
- Lingua:
- Tedesco
Acquistabile con
o la
Descrizione VLSI Design and Test
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
o 3 rate da € 21.69 senza interessi con 
Disponibile in 10-12 giorni
Prenota e ritira
Scegli il punto di consegna e ritira quando vuoiRecensioni degli utenti
e condividi la tua opinione con gli altri utenti
