Thin Film Analysis By X-ray Scattering
- Editore:
Wiley-vch Verlag Gmbh
- EAN:
9783527310524
- ISBN:
3527310525
- Pagine:
- 378
- Formato:
- Hardback
- Lingua:
- Tedesco
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Descrizione Thin Film Analysis By X-ray Scattering
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.
Fuori catalogo - Non ordinabile
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