Structured Illumination X-ray Microscopy

Extending the resolution of imaging systems above Abbe's limit is unequivocally beneficial for many applications where a further enhancement of the numerical aperture is either too complicated or just impossible. The Structured Illumination (S.I.) method is successfully applied in visible light microscopy and potentially doubles the resolution of diffraction limited systems. In comparison with light microscopes, microscopy in the X-ray region of the electromagnetic spectrum offers great advantages such as resolving smaller spot sizes and exploiting the benefits of element specific contrast. In order to enhance the resolution of X-ray microscopes utilizing state of the art zone plate lenses, it is highly desirable to adapt the S.I. method to X-ray microscopy. The question of feasibility and reasonability of this adaption is the fundamental matter of this study. Two methods are suggested that might be useful to greatly enhance the resolution of microscopes. The first method relies on S.I. and takes advantage of higher orders from a physical grating placed close to the object. The other method transfers the S.I. concept to an off axis illumination scheme.