Alta reperibilità
Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
- Editore:
Springer US
- EAN:
9781461349693
- ISBN:
1461349699
- Pagine:
- 720
- Formato:
- Paperback
- Lingua:
- Inglese
Acquistabile con la
Descrizione Scanning Electron Microscopy and X-Ray Microanalysis
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
o 3 rate da € 45.01 senza interessi con 
Disponibile in 10-12 giorni
Prenota e ritira
Scegli il punto di consegna e ritira quando vuoiRecensioni degli utenti
e condividi la tua opinione con gli altri utenti
