X-ray Diffraction At Elevated Temperatures
A Method For In Situ Process Analysis
- Editore:
John Wiley And Sons Ltd
- EAN:
9780471187264
- ISBN:
0471187267
- Pagine:
- 268
- Formato:
- Hardback
- Lingua:
- Inglese
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Descrizione X-ray Diffraction At Elevated Temperatures
In light of the growing importance and availability of intense x-ray sources and position-sensitive detectors, this book offers comprehensive treatment of the principles, instrumentation, and applications of x-ray diffraction at elevated temperatures.
Fuori catalogo - Non ordinabile
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