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Optimization Studies with Multiple Testing, Loss-Based Estimation, and Confidence Intervals for Negative Binomials of High Dispersion. di David Alan Shilane edito da Proquest, Umi Dissertation Publishing

Optimization Studies with Multiple Testing, Loss-Based Estimation, and Confidence Intervals for Negative Binomials of High Dispersion.

di

David Alan Shilane

Editore:: Proquest, Umi Dissertation Publishing
EAN:: 9781243996299
ISBN:: 1243996293
Pagine:: 204
Formato:: Paperback
Lingua:: Inglese

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