Nonlinear Transistor Model Parameter Extraction Techniques di Matthias Rudolph edito da Cambridge University Press

Nonlinear Transistor Model Parameter Extraction Techniques

EAN:

9780521762106

ISBN:

0521762103

Pagine:
366
Formato:
Hardback
Lingua:
Inglese
Acquistabile con o la

Descrizione Nonlinear Transistor Model Parameter Extraction Techniques

Achieve accurate and reliable parameter extraction using a broad range of techniques and methods provided. Experts from industry and academia present real-world examples and insights into key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects.

Fuori catalogo - Non ordinabile
€ 104.16

Recensioni degli utenti

e condividi la tua opinione con gli altri utenti