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Noncontact Atomic Force Microscopy
- Editore:
Springer Berlin Heidelberg
- Collana:
- Nanoscience And Technology
- EAN:
9783642627729
- ISBN:
3642627722
- Pagine:
- 460
- Formato:
- Paperback
- Lingua:
- Tedesco
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Descrizione Noncontact Atomic Force Microscopy
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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