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Modeling and Characterization of RF and Microwave Power Fets
- Editore:
Cambridge University Press
- EAN:
9780521336178
- ISBN:
0521336171
- Pagine:
- 380
- Formato:
- Paperback
- Lingua:
- Inglese
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Descrizione Modeling and Characterization of RF and Microwave Power Fets
This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.
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