ISTFA 2010
- Editore:
ASM International
- EAN:
9781615030415
- ISBN:
1615030417
- Pagine:
- 464
- Formato:
- Paperback
- Lingua:
- Inglese
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Descrizione ISTFA 2010
Features research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included.
Fuori catalogo - Non ordinabile
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