Introduction to Scanning Tunneling Microscopy di C. Julian Chen edito da OUP Oxford

Introduction to Scanning Tunneling Microscopy

Editore:

OUP Oxford

EAN:

9780199211500

ISBN:

0199211507

Pagine:
488
Formato:
Hardback
Lingua:
Inglese
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Descrizione Introduction to Scanning Tunneling Microscopy

The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.

Fuori catalogo - Non ordinabile
€ 125.78

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