Intellectual Property Damages di Mark A. Glick, Lara A. Reymann, Richard Hoffman edito da John Wiley And Sons Ltd

Intellectual Property Damages

Guidelines And Analysis

EAN:

9780471464594

ISBN:

0471464597

Pagine:
112
Formato:
Paperback
Lingua:
Inglese
Acquistabile con la

Descrizione Intellectual Property Damages

A supplement to "Intellectual Property Damages: Guidelines and Analysis". It contains the following chapters: Applying Statistical Analysis to the Market Approach; Use of Event Studies in Damage Calculations; How to Calculate Patent Damages; Cost Analysis; and, Risk, Discount Rates, and Prejudgment Interest.

Fuori catalogo - Non ordinabile
€ 45.00

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