Intellectual Property Damages
Guidelines And Analysis
- Editore:
John Wiley And Sons Ltd
- EAN:
9780471464594
- ISBN:
0471464597
- Pagine:
- 112
- Formato:
- Paperback
- Lingua:
- Inglese
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Descrizione Intellectual Property Damages
A supplement to "Intellectual Property Damages: Guidelines and Analysis". It contains the following chapters: Applying Statistical Analysis to the Market Approach; Use of Event Studies in Damage Calculations; How to Calculate Patent Damages; Cost Analysis; and, Risk, Discount Rates, and Prejudgment Interest.
Fuori catalogo - Non ordinabile
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