Fundamentals of Modern VLSI Devices di Yuan (University of California Taur, Tak H. Ning edito da Cambridge University Press

Fundamentals of Modern VLSI Devices

EAN:

9781107635715

ISBN:

1107635713

Pagine:
680
Formato:
Paperback
Lingua:
Inglese
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Descrizione Fundamentals of Modern VLSI Devices

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The internationally renowned authors highlight the interdependencies and trade-offs between practically important device parameters and discuss device scaling and scaling limits of CMOS and bipolar devices.

Fuori catalogo - Non ordinabile
€ 55.20

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