Failure Analysis of Integrated Circuits edito da Springer US
Alta reperibilità

Failure Analysis of Integrated Circuits

Tools and Techniques

Editore:

Springer US

EAN:

9780412145612

ISBN:

0412145618

Pagine:
276
Formato:
Hardback
Lingua:
Inglese
Acquistabile con o la

Descrizione Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.

Spedizione gratuita
€ 174.61€ 181.89
Risparmi:€ 7.28(4%)
o 3 rate da € 58.20 senza interessi con
Disponibile in 10-12 giorni
servizio Prenota Ritiri su libro Failure Analysis of Integrated Circuits
Prenota e ritira
Scegli il punto di consegna e ritira quando vuoi

Recensioni degli utenti

e condividi la tua opinione con gli altri utenti