Alta reperibilità
DFT Study of Properties of Surface Passivated Silicon Nanoclusters
- Editore:
LAP Lambert Academic Publishing
- EAN:
9783659491566
- ISBN:
365949156X
- Pagine:
- 56
- Formato:
- Paperback
- Lingua:
- Tedesco
Acquistabile con
o la
Descrizione DFT Study of Properties of Surface Passivated Silicon Nanoclusters
This book represents the computational work done on silicon nanoclusters, using the famous density functional theory and time dependent density functional theory. Density functional theory is a very popular tool used by scientists these days for verifying several crucial properties of the nanosized materialsHere the single atom surface passivation was done on the small sized silicon clusters. Further, the IR spectra, band gap and the absorption properties were studied.
o 3 rate da € 12.71 senza interessi con 
Disponibile in 10-12 giorni
Prenota e ritira
Scegli il punto di consegna e ritira quando vuoiRecensioni degli utenti
e condividi la tua opinione con gli altri utenti
