Characterization Of Microstructures By Analytical Electron Microscopy (aem) di Yonghua Rong edito da Springer-verlag Berlin And Heidelberg Gmbh & Co. Kg

Characterization Of Microstructures By Analytical Electron Microscopy (aem)

EAN:

9783642201189

ISBN:

3642201180

Pagine:
570
Formato:
Hardback
Lingua:
Tedesco
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Descrizione Characterization Of Microstructures By Analytical Electron Microscopy (aem)

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

Fuori catalogo - Non ordinabile
€ 181.77

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