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Characterization of High Tc Materials and Devices by Electron Microscopy
- Editore:
Cambridge University Press
- EAN:
9780521554909
- ISBN:
052155490X
- Pagine:
- 406
- Formato:
- Hardback
- Lingua:
- Inglese
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Descrizione Characterization of High Tc Materials and Devices by Electron Microscopy
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
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