Characterization of High Tc Materials and Devices by Electron             Microscopy edito da Cambridge University Press
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Characterization of High Tc Materials and Devices by Electron Microscopy

EAN:

9780521554909

ISBN:

052155490X

Pagine:
406
Formato:
Hardback
Lingua:
Inglese
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Descrizione Characterization of High Tc Materials and Devices by Electron Microscopy

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

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