Automated Model-based Test Generation for Timed Systems di Elisangela Vieira edito da LAP Lambert Acad. Publ.
Alta reperibilità

Automated Model-based Test Generation for Timed Systems

An overview about models, specification languages and test generation approaches considering time constraintes

EAN:

9783838355849

ISBN:

3838355849

Pagine:
200
Formato:
Paperback
Lingua:
Tedesco
Acquistabile con o la

Descrizione Automated Model-based Test Generation for Timed Systems

Model-based test generation is an approach to generate test cases based on a formal model. Although test generation methods have long existed, its timed counterpart is still a new field. In addition, most of the proposed solutions suffer from combinatory explosion which continues to limit their applicability in practice. Accordingly, it explains why there are so few automatic formal methods for testing generation, for both time and untimed systems. This book presents an overview about models, specification languages and test generation approches adressed to timed systems. In addition, it proposes a test generation approach using test-purposes and considering timed constraints. In order to evaluate the applicability and efficiency of the proposed method, two real industrial applications are used as case studies: a Railroad Crossing and a Vocal Service furnished by France Telecom.

Spedizione gratuita
€ 70.86
o 3 rate da € 23.62 senza interessi con
Disponibile in 10-12 giorni
servizio Prenota Ritiri su libro Automated Model-based Test Generation for Timed Systems
Prenota e ritira
Scegli il punto di consegna e ritira quando vuoi

Recensioni degli utenti

e condividi la tua opinione con gli altri utenti