Applied Scanning Probe Methods Iv edito da Springer-verlag Berlin And Heidelberg Gmbh & Co. Kg
Alta reperibilità

Applied Scanning Probe Methods Iv

Industrial Applications

EAN:

9783540269120

ISBN:

3540269126

Pagine:
284
Formato:
Hardback
Lingua:
Tedesco
Acquistabile con o la

Descrizione Applied Scanning Probe Methods Iv

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

Spedizione gratuita
€ 142.69€ 150.20
Risparmi:€ 7.51(5%)
o 3 rate da € 47.56 senza interessi con
Disponibile in 10-12 giorni
servizio Prenota Ritiri su libro Applied Scanning Probe Methods Iv
Prenota e ritira
Scegli il punto di consegna e ritira quando vuoi

Recensioni degli utenti

e condividi la tua opinione con gli altri utenti