Alta reperibilità
Advances in X-Ray Analysis
Volume 10
- Editore:
Springer US
- EAN:
9781468478372
- ISBN:
1468478370
- Pagine:
- 572
- Formato:
- Paperback
- Lingua:
- Inglese
Acquistabile con
o la
Descrizione Advances in X-Ray Analysis
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
Disponibile in 10-12 giorni
Recensioni degli utenti
e condividi la tua opinione con gli altri utenti