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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano

 

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Descrizione

This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.

Dettagli del libro

  • Titolo: Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano
  • Redattori: David G. Seiler, Alain C. Diebold, Robert McDonald
  • Editore: American Institute of Physics
  • Data di Pubblicazione: September 2007
  • ISBN: 0735404410
  • ISBN-13: 9780735404410
  • Pagine: 00578
  • Reparto: Measurement

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